Technical gap of insufficient development of temperature shock test chamber
Industry experts believe that for the temperature shock test chamber, we are always following in the footsteps of others and are catching up. This is the biggest problem in technology. For example, in recent years, it has been the strength of various high and new technologies in terms of test equipment. However, these high and new technologies are all developed and defined by foreign countries. System architecture and test methods, in most cases we have to buy their products to meet domestic test system requirements.
If it is said that in these system-level test instruments, because of the relatively high gap between the high and new technology of the temperature shock test chamber, then the gap between the domestic and foreign test equipment is almost difficult to measure. The industry believes that for basic test instruments, its architecture and concepts are not difficult to understand, but when it comes to specific function definitions and product function realization, we have a large gap, which makes China's test instrument development It's an awkward cycle with the application: we can't track the cutting-edge technology of advanced electronic technology development, there is no way to understand its testing needs, and naturally we cannot develop test instruments suitable for the latest technology for this, so let alone grasp The latest test market pulse and the most profitable part of the profit; and you ca n’t do the test of advanced new technology, you ca n’t catch it when the new technology appears, and others ca n’t hand it to you to meet the initial testing needs. , So that you ca n’t understand the latest technology trends, and you ca n’t apply new technologies to your test equipment.
It is understood that in application testing, a more important problem restricting the application of local test instruments comes from the lack of temperature shock test chambers: domestic test instrument companies, whether they are old state-owned research institutes or emerging private test instrument companies, have their own Compared with international giants, chip R & D capabilities have a large gap. It can be said that the chips used for testing are difficult to find relevant products on the market because of their special requirements. Especially in the field of signal analysis and signal acquisition, the shortage of analog front-end technology and signal acquisition technology is directly reflected in domestic Test instruments cannot capture some of the characteristic signals needed, such as most of the needs of radar and microwave technology, and commercial chips cannot meet their test needs. As a result, domestic test instrument manufacturers do not know how to meet, but There is no relevant semiconductor device that can make products that meet these sampling rates and bandwidth requirements, and these two points are precisely the premise of many signal analysis and signal processing in practical applications.
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